Semiconductor device having a mismatch detection and correction circuit

A semiconductor device, comprising:

• an integrated circuit (IC) including an internal circuit;
• and
• a mismatch detection and correction circuit connected to the internal circuit of the IC, the mismatch detection and correction circuit configured to detect a process mismatch and correct an error in the internal circuit caused by the process mismatch using a current difference between a first current and a second current based on a charged voltage of a capacitor,
• wherein the process mismatch is due to a variation in the manufacture of the internal circuit.