Semiconductor device and failure detection method

A failure detection method, comprising:

• correcting an error of a digital signal corresponding to an analog signal processed by an analog circuit using a digital assist circuit;
• and
• detecting whether the analog circuit has a failure based on a correction amount by the digital assist circuit,
• wherein the digital assist circuit comprises:
• a weight coefficient calculation unit;
• and
• a correction unit.

A semiconductor device, comprising:

• an analog circuit
• a digital assist circuit that corrects an error of a digital signal corresponding to an analog signal processed by the analog circuit;
• and
• a failure detection circuit that detects whether the analog circuit has a failure based on a correction amount by the digital assist circuit,
• wherein the analog circuit comprises an analog-to-digital (AD) converter and wherein a variation of elements constituting the AD converter is smaller than 0.5 of a least significant bit (LSB) of the AD converter.