Method to convert OVM/UVM-based pre-silicon tests to run post-silicon on a tester

A non-transitory computer-readable medium storing a plurality of testing instructions which, when executed by a processor, cause the processor to perform operations, the operations comprising:

• running a simulation test on a device under test using a simulation testbench having input stimuli and an expected output associated with the simulation test, wherein the expected output is a function of the input stimuli and wherein the input stimuli comprise a clock signal;
• converting the simulation test into a data file, the converting comprising:
• capturing the input stimuli at a plurality of input capture times according to the clock signal;
• capturing the expected output at a plurality of output capture times according to the clock signal;
• generating, for each particular edge of the clock signal, first and second vectors, wherein:
• the first vector comprises the captured input stimuli associated with the current particular edge of the clock signal and the captured expected output associated with the prior particular edge of the clock signal;
• and
• the second vector comprises the captured input stimuli associated with the current particular edge of the clock signal and the captured expected output associated with the current particular edge of the clock signal;
• and
• writing the generated first and second vectors for each particular edge of the clock signal to the data file;
• configuring a programmable integrated circuit (IC);
• and
• testing the configured programmable IC based on the data file.

A programmable integrated circuit (IC) test system comprising:

• a test board configured to receive a programmable IC for testing;
• a memory;
• and
• one or more processors coupled to the test board and to the memory, the one or more processors being configured to:
• run a simulation test on a device under test using a simulation testbench having input stimuli and an expected output associated with the simulation test, wherein the expected output is a function of the input stimuli and wherein the input stimuli comprise a clock signal;
• convert the simulation test into a data file by:
• capturing the input stimuli at a plurality of input capture times according to the clock signal;
• capturing the expected output at a plurality of output capture times according to the clock signal;
• generating, for each particular edge of the clock signal, first and second vectors, wherein:
• the first vector comprises the captured input stimuli associated with the current particular edge of the clock signal and the captured expected output associated with the prior particular edge of the clock signal;
• and
• the second vector comprises the captured input stimuli associated with the current particular edge of the clock signal and the captured expected output associated with the current particular edge of the clock signal;
• storing, in the memory, the data file with the generated first and second vectors for each particular edge of the clock signal written thereto;
• configure the programmable IC via the test board;
• and
• test the configured programmable IC based on the data file.