Turret handler for testing electronic elements with leads

A turret handler, adapted to test an electronic element, wherein the electronic element comprises an element body and a plurality of leads, comprising:

• a nozzle, adapted to hold the element body to move the electronic element;
• a stage;
• a test block, disposed on the stage, wherein the nozzle moves the electronic element to the test block, comprising:
• a coupling unit, comprising a coupling portion, a pressing portion and an elastic structure, wherein the elastic structure is connected to the pressing portion;
• and
• an initiative portion, connected to the elastic structure;
• and
• an abutting unit, wherein in an access state, the abutting unit applies a reaction force to the initiative portion, the initiative portion pushes the elastic structure, the pressing portion is in a first orientation, and the electronic element is picked or placed, and in a test state, the abutting unit is separated from the test block, the reaction force upon the initiative portion is released, the initiative portion releases the elastic structure, the pressing portion is moved to a second orientation to press the leads and the coupling portion, and the electronic element is tested through the coupling portion.