US 10,310,008 B2 · Method and system for testing an electronic unit

Abstract

A method of testing an electronic unit by comparing resulting signal shapes from the unit to be tested and a known functioning unit. The method includes powering off the units for testing and feeding one or more predefined signal shapes of two or more different frequencies as input signals to the known functioning unit and to the unit to be tested at corresponding test points. The method further includes measuring the resulting signal shapes from both units at corresponding measurement points and comparing at least one resulting signal shape from the known functioning unit with the corresponding resulting signal shape from the unit to be tested. The method also includes detecting a fault in the unit to be tested on the basis of an existing signal shape distortion in time axis of the resulting signal shape received from the unit to be tested.

Claims21

Dependent claims

A method of testing an electronic unit by comparing resulting signal shapes from the unit to be tested and a known functioning unit, the signal shapes from both units being compared by means of the frequency response of the electronic unit, the method including:

a) powering off the units for testing,
b) feeding one or more predefined signal shapes of two or more different frequencies as input signals to the known functioning unit and to the unit to be tested at corresponding test points,
c) measuring the resulting signal shapes from both units at corresponding measurement points,
d) comparing at least one resulting signal shape from the known functioning unit with the corresponding resulting signal shape from the unit to be tested, and
e) detecting a fault in the unit to be tested on the basis of an existing signal shape distortion in time axis of the resulting signal shape received from the unit to be tested.

2 more elements

A system for testing an electronic unit, comprising

a) at least one electronic functioning unit,
b) at least one electronic unit under test being comprised in the system simultaneously or interchangeably with the electronic functioning unit,
c) a signal generator connectable to the electronic units, the signal generator being configured to create one or more signals with pre-defined signal shapes of varying frequencies and to feed the created signals as input signals to the electronic functioning unit and simultaneously or separately to the electronic unit under test, and
d) a measurement instrument connectable to the electronic units, the measurement instrument being configured to:
receive at least one resulting signal shape simultaneously or separately from the electronic functioning unit and from the electronic unit under test,
transform said at least one resulting signal shape into discrete values that describe the signal shape, and
present information of said at least one resulting signal shape.

4 more elements

Dependencies are inferred from the claim text.

Method and system for testing an electronic unit

Life of this patent

Method and system for testing an electronic unit

Life of this patent

Abstract

Claims21