Semiconductor apparatus and system

A system comprising:

• a plurality of semiconductor apparatuses each including:
• a semiconductor circuit;
• a voltage generator that selects one of at least two types of voltages and applies the selected voltage to the semiconductor circuit, the at least two types of voltages including a normal voltage at which the semiconductor circuit normally operates and a low voltage which is lower than the normal voltage;
• a clock generator that supplies the semiconductor circuit with a clock signal having a constant frequency regardless of the voltage to be applied to the semiconductor circuit;
• and
• a test circuit that performs a test of the semiconductor circuit while the voltage generator supplying the low voltage to the semiconductor circuit and determines, based on the test, whether the semiconductor circuit normally operates or not;
• and
• a database,
• wherein each semiconductor apparatus supplies at least through the clock generator thereof to the semiconductor circuit thereof with the clock signal having the constant frequency regardless of the voltage to be applied to the semiconductor circuit thereof, determines through the test circuit, while the clock generator thereof supplying the clock signal with the constant frequency to the semiconductor circuit thereof, whether the semiconductor circuit thereof normally operates or not, and transmits to the database, information about regions of the semiconductor circuit thereof in which the semiconductor circuit thereof does not normally operate, and
• based on determination results of the plurality of semiconductor apparatuses, the database transmits, to the plurality of semiconductor apparatuses, an instruction to verify whether the semiconductor circuit normally operates in the regions in a descending order of the number of determination results indicating that the semiconductor circuit does not normally operate.