Substrate for sample analysis, sample analysis device, sample analysis system, and program for sample analysis system
AssigneePhc Holdings Corporation
InventorsMasahiro Johno, Fusatoshi Okamoto
Life of this patent
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AssigneePhc Holdings Corporation
InventorsMasahiro Johno, Fusatoshi Okamoto
Estimating the term…
A substrate for sample analysis has a rotation axis, a first chamber having a first space for retaining a liquid, a second chamber having a second space for retaining the liquid to be discharged from the first chamber, and a first channel having a path connecting the first chamber and the second chamber. The first space includes a first portion and a second portion, and a coupling portion located between the first and second portions. The substrate includes a wall portion partitioning the first and second portions from each other. The second chamber is more distant from the rotation axis than is the first portion. The coupling portion is closer to the rotation axis than is the wall portion. The second portion at least includes a portion which is more distant from the rotation axis than is the first portion.
A substrate for sample analysis on which transfer of a liquid is to occur with rotational motion, the substrate for sample analysis comprising:
Dependencies are inferred from the claim text.