Device for detecting chemical/physical phenomenon
AssigneeNational University Corporation Toyohashi University of Technology
InventorsFumihiro Dasai, Kazuaki Sawada
Life of this patent
Estimating the term…
Loading patent…
AssigneeNational University Corporation Toyohashi University of Technology
InventorsFumihiro Dasai, Kazuaki Sawada
Estimating the term…
Proposed is a device for detecting a chemical/physical phenomenon, in which, via a novel scheme, charges are accumulated in a charge accumulation region. An amount of charges thus accumulated reflects the potential of a sensing region and the potential corresponds to an external environment (chemical phenomenon or physical phenomenon) to be detected. A charge accumulation region 5 includes a first potential well region FD1 that is continuous with a sensing region 3, the boundary potential of the charges held in the first potential well region FD1 being made equal to the potential of the sensing region 3, whereby the potential of the sensing region 3 is made to be reflected in the amount of charges held in the first potential well region FD1.
A method for controlling chemical or physical phenomenon detecting device, wherein the device comprises a semiconductor substrate in which a sensing region and a charge accumulation region are partitioned, a potential of the sensing region changes in accordance with a change in an external environment, and an amount of charges reflecting the potential of the sensing region is accumulated in the charge accumulation region and the accumulated charges are detected
A chemical or physical phenomenon detecting device comprising a semiconductor substrate containing a sensing region and a charge accumulation region, wherein:
A method of measuring a chemical or physical phenomenon using a chemical or physical phenomenon detecting device wherein:
Dependencies are inferred from the claim text.