Methods and apparatus for x-ray diffraction
AssigneeUniversity of Leicester
InventorGraeme Mark Hansford
Life of this patent
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Abstract
Methods and apparatus are provided for performing back-reflection energy-dispersive X-ray diffraction (XRD). This exhibits extremely low sensitivity to the morphology of the sample under investigation. As a consequence of this insensitivity, unprepared samples can be analyzed using this method. For example, in a geological context, whole rock samples become amenable to analysis. A composite diffraction spectrum can be produced using information from different recorded spectra in different energy sub-ranges. The composite spectrum excludes fluorescence signals that would otherwise obscure the diffraction signals.
Claims10
A method of inspecting a material sample by X-ray diffraction, the method comprising:
- irradiating the material sample with a beam of X-ray radiation from a source with a range of photon energies;
- obtaining at least one energy-resolved spectrum from radiation diffracted substantially back toward the source at diffraction angles greater than 155°;
- and
- processing the at least one energy-resolved spectrum to obtain information on spacing of crystal planes in the material sample, the obtained information being substantially independent of sample distance or morphology.
An apparatus for use in performing energy-dispersive X-ray diffraction to determine characteristics of a material sample, the apparatus comprising:
- a source arrangement for irradiating the material sample with a beam of radiation with a range of photon energies;
- a detector for detecting radiation diffracted from a sample in a direction substantially back towards the source arrangement at diffraction angles greater than 155°;
- a processor configured to:
- resolve radiation detected by the detector into at least one energy-resolved spectrum;
- and
- process the at least one energy-resolved spectrum to obtain information on spacing of crystal planes in the material sample, the information on spacing of crystal planes in the material sample being substantially independent of sample distance or morphology.
Dependencies are inferred from the claim text.