Characterization of trace crystallinity by second harmonic generation microscopy
AssigneePurdue Research Foundation
InventorsGarth Jason Simpson, Paul David Schmitt
Life of this patent
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Abstract
A method for quantifying crystallinity within a sample using second harmonic generation microscopy is described herein. In one aspect, a method for reducing the timeframe for accelerated stability testing of amorphous solid dispersions of active pharmaceutical ingredients though identifying regions of interest to quantify crystallinity and composition is presented herein.
Claims8
A method for identifying composition, the method comprising:
- acquiring at least one second harmonic generation (SHG) image of a sample;
- analyzing the at least one SHG image to obtain at least one field of view;
- generating a plurality of particle histograms from the at least one field of view;
- locating at least one region of interest within the at least one field of view of the at least one SHG image;
- acquiring at least one Raman spectrum from the at least one region of interest;
- assessing composition of an individual particle via spectral analysis of the at least one Raman spectrum;
- acquiring at least one x-ray diffraction (XRD) image from the at least one region of interest;
- producing a representative powder pattern of the individual particle from the at least one XRD image;
- and
- comparing the representative powder pattern with a set of powder patterns from a database to validate composition of the individual particle.
A method for identifying composition of an individual particle, the method comprising:
- acquiring at least one second harmonic generation (SHG) image of a sample;
- analyzing the at least one SHG image to obtain at least one field of view;
- generating a plurality of particle histograms from the at least one field of view;
- locating at least one region of interest within the at least one field of view of the at least one SHG image;
- acquiring at least one Raman spectrum from the at least one region of interest;
- assessing composition of the individual particle via spectral analysis of the at least one Raman spectrum;
- and
- determining composition of the individual particle.
A method for identifying composition of an individual particle, the method comprising:
- acquiring at least one second harmonic generation (SHG) image of a sample;
- analyzing the at least one SHG image to obtain at least one field of view;
- generating a plurality of particle histograms from the at least one field of view;
- locating at least one region of interest within the at least one field of view of the at least one SHG image;
- acquiring at least one x-ray diffraction (XRD) image from the at least one region of interest;
- assessing composition of the individual particle via spectral analysis of the at least one XRD image;
- and
- determining composition of the individual particle.
Dependencies are inferred from the claim text.