Profile measuring method, profile measuring apparatus, and deformation detecting apparatus
AssigneeUtechzone Co., Ltd.
InventorsYueh-Long Lee, Po-Tsung Lin
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AssigneeUtechzone Co., Ltd.
InventorsYueh-Long Lee, Po-Tsung Lin
Estimating the term…
A profile measuring method used to measure a profile of an object-under-test includes the following steps. A light source, a light-transmissive projection film, and an image capturing device are provided, where the light-transmissive projection film is located between the light source and the image capturing device. The object-under-test is placed between the light source and the light-transmissive projection film, and a light beam is provided toward the light-transmissive projection film by the light source, to form an object-under-test projection of the object-under-test on the light-transmissive projection film. An image of the object-under-test projection is captured by the image capturing device, to obtain a projection size of the object-under-test projection. A measuring size of the object-under-test is calculated according to the projection size of the object-under-test projection. In addition, a profile measuring apparatus and a deformation detecting apparatus are also provided.
A profile measuring method, configured to measure a profile of an object-under-test, comprising:
A profile measuring device, configured to measure a profile of an object-under-test, comprising:
A deformation detecting apparatus, comprising:
Dependencies are inferred from the claim text.