Surface coating cutting tool

A surface-coated cutting tool, comprising:

• a tool body that is made of a cemented carbide made from tungsten carbide or a titanium carbonitride cermet;
• and
• a hard coating layer that is deposited on a surface of the tool body,
• wherein the hard coating layer has a lower layer that is formed on the surface of the tool body and an upper layer that is formed on the lower layer,
• (a) the lower layer is made of a Ti compound layer, which has an average total layer thickness of 3 to 20 μm, and is composed of two or more of a TiC layer, a TiN layer, a TiCN layer, a TiCO layer, and a TiCNO layer, the Ti compound layer including at least one TiCN layer,
• (b) the upper layer is made of an Al2O3 layer, which has an average layer thickness of 1 to 30 μm and has an α-type crystal structure in a chemically deposited state,
• (c) regarding Al2O3 crystal grains of the upper layer, in a coincidence grain boundary distribution graph showing ratios of coincidence grain boundary lengths formed of respective constituent atom-sharing lattice points to the whole coincidence grain boundary length, a highest peak is present in Σ3 in the range of Σ3 to Σ29, and a distribution ratio of Σ3 occupies 35 to 70% of the whole coincidence grain boundary length of Σ3 or more, when electron beams are irradiated to the individual crystal grains in a measurement range of a polished cross-section by using a field-emission-type scanning electron microscope and an electron beam backward scattering diffraction device to measure angles of orientations of normal lines of crystal lattice planes having a corundum hexagonal crystal lattice, a crystal orientation relationship between the adjacent crystal lattices is calculated based on the measurement result, a distribution of a coincidence grain boundary formed of lattice points (constituent atom-sharing lattice points) where each of constituent atoms of a crystal lattice interface shares one constituent atom between the crystal lattices is calculated, and distribution ratios of individuals of ΣN+1 are calculated when ΣN+1 represents the constituent atom-sharing lattice point type in which there are N lattice points sharing no constituent atoms between the constituent atom-sharing lattice points,
• (d) regarding the Al2O3 crystal grains of the upper layer, in a coincidence grain boundary distribution graph showing ratios of coincidence grain boundary lengths formed of respective constituent atom-sharing lattice points to the whole coincidence grain boundary length, a total distribution ratio of the coincidence grain boundary of Σ31 or more occupies 25 to 60% of the whole coincidence grain boundary length of Σ3 or more, when electron beams are irradiated to the individual crystal grains in a measurement range of a polished cross-section by using a field-emission-type scanning electron microscope and an electron beam backward scattering diffraction device to measure angles of orientations of normal lines of crystal lattice planes having a corundum hexagonal crystal lattice, a crystal orientation relationship between the adjacent crystal lattices is calculated based on the measurement result, a distribution of a coincidence grain boundary formed of lattice points (constituent atom-sharing lattice points) where each of constituent atoms of a crystal lattice interface shares one constituent atom between the crystal lattices is calculated, and distribution ratios of individuals of ΣN+1 are calculated when ΣN+1 represents the constituent atom-sharing lattice point type in which there are N lattice points sharing no constituent atoms between the constituent atom-sharing lattice points, and
• an outermost surface layer of the lower layer is made of a TiCN layer having a layer thickness of at least 500 nm or more,
• except for oxygen as an inevitable impurity, oxygen is contained only in a depth region with a depth of up to 500 nm from an interface between the TiCN layer and the upper layer, and
• an average content of the oxygen contained in the depth region is 1 to 3 atom % of a total content of Ti, C, N, and O contained in the depth region.