Method and device for recognizing and removing undesired artifacts in multichannel magnetic field or electric potential measurements
AssigneeElekta Limited
InventorsSamu Taulu, Matti Kajola, Juha Simola
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AssigneeElekta Limited
InventorsSamu Taulu, Matti Kajola, Juha Simola
Estimating the term…
The present invention introduces a method, device and a computer program for removing artifacts present in individual channels of a multichannel measurement device. At first, a basis is generated defining an n-dimensional subspace of the N-dimensional signal space, where n is smaller than N, where using in the definition of the n-dimensional basis a physical model of a Signal Space Separation method, or a statistical model based on the statistics of recorded N-dimensional signals. Thereafter, a combined (n+m)-dimensional basis is formed by adding m signal vectors to the n-dimensional basis, each of these m signal vectors representing a signal present only in a single channel of the N-channel device. After this the recorded N-dimensional signal vector is decomposed into n+m components in the combined basis, and finally, components corresponding to the m added vectors in the combined basis are subtracted from the recorded N-dimensional signal vector.
A method for recognizing and removing undesired artifacts and sensor-specific interference signals in at least one measurement channel of a multichannel magnetic field or electric potential measurement, wherein a measurement device comprises a set of N measurement sensors and a data processing logic, and wherein the method comprises the step of:
A multichannel measurement device arranged to recognize and remove undesired artifacts and sensor-specific interference signals in at least one measurement channel of a multichannel magnetic field or electric potential measurement, wherein the measurement device comprises
A computer program for recognizing and removing undesired artifacts and sensor-specific interference signals in at least one measurement channel of a multichannel magnetic field or electric potential measurement, wherein a measurement device comprises a set of N measurement sensors and a data processing logic, and wherein the computer program comprises program code which, when run on an electronic processor, is arranged to execute the steps of:
Dependencies are inferred from the claim text.