Semiconductor memory device
AssigneeToshiba Memory Corporation
InventorsYusuke Kobayashi, Yoshihisa Iwata, Takeshi Sugimoto
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AssigneeToshiba Memory Corporation
InventorsYusuke Kobayashi, Yoshihisa Iwata, Takeshi Sugimoto
Estimating the term…
According to the embodiment, a semiconductor memory device includes a first conductive layer, a second conductive layer, a first memory cell, a second memory cell, a third conductive layer, a first contact, a intermediate memory cell, a fourth conductive layer, a third memory cell, a fifth conductive layer, and a second contact. The third conductive layer is separated from the first conductive layer and the second conductive layer in a third direction crossing a first direction and crossing a second direction and extends in the second direction. The fifth conductive layer is separated from the second conductive layer in the third direction and extends in the second direction. A first length of the second conductive layer along the second direction is shorter than a second length of the fifth conductive layer along the second direction.
A memory device comprising:
A memory device comprising:
Dependencies are inferred from the claim text.