Determination of constellation impairment parameters via error-vector magnitude minimization
AssigneeTektronix, Inc.
InventorsSteven A. Jacobs, Robert A. Marsland, Jr.
Life of this patent
Estimating the term…
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AssigneeTektronix, Inc.
InventorsSteven A. Jacobs, Robert A. Marsland, Jr.
Estimating the term…
A test and measurement system is disclosed. The system includes a data store with a data description of a received in-phase (I) quadrature (Q) symbol. The received IQ symbol is received from a transmitter associated with impairments, and the received IQ symbol is modified from a corresponding ideal IQ symbol by the impairments. A computer processor is coupled to the data store and generates an Error-Vector Magnitude (EVM) function that describes a difference between the received IQ symbol and the ideal IQ symbol in terms of a plurality of impairment parameters indicating the impairments. The processor then determines values for the impairment parameters that quantify the impairments. The values are determined by selection of values for the impairment parameters that minimize the EVM function.
A test and measurement system comprising:
A method comprising:
A non-transitory computer readable storage medium having instructions stored thereon that, when executed by a processor of a test and measurement system, cause the test and measurement system to perform the steps of:
Dependencies are inferred from the claim text.