Corrosion resistant test lines
AssigneeApple Inc.
InventorsTsung-Ting Tsai, Chin-Wei Lin, Jae Won Choi, Young Bae Park
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AssigneeApple Inc.
InventorsTsung-Ting Tsai, Chin-Wei Lin, Jae Won Choi, Young Bae Park
Estimating the term…
A display may have an array of pixels formed from thin-film transistor circuitry. The thin-film transistor circuitry may include thin-film layers of dielectric, semiconductor, and metal on a dielectric substrate. Test structures may be formed around the periphery of the substrate to facilitate testing of the thin-film circuitry during manufacturing. The test structures may include test pads that are coupled to the thin-film circuitry by test lines extending from the thin-film circuitry. Following testing, the outermost portions of the display and the test pads on these display portions may be removed by cutting the substrate along a substrate cut line. The test lines may be formed from parallel lines that are shorted together, semiconductor layers, multiple layers of conductive material, and other structures that resist corrosion along the cut line.
A component, comprising:
A display, comprising:
An organic light-emitting diode display, comprising:
Dependencies are inferred from the claim text.