Dopant introduction method and heat treatment method
AssigneeSCREEN Holdings Co., Ltd.
InventorsKazuhiko Fuse, Hideaki Tanimura, Shinichi Kato
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AssigneeSCREEN Holdings Co., Ltd.
InventorsKazuhiko Fuse, Hideaki Tanimura, Shinichi Kato
Estimating the term…
A thin film containing a dopant is deposited on a surface of a semiconductor wafer. The semiconductor wafer on which the thin film containing the dopant is deposited is rapidly heated to a first peak temperature by irradiation with light from halogen lamps, so that the dopant is diffused from the thin film into the surface of the semiconductor wafer. The thermal diffusion using the rapid heating achieves the introduction of the necessary and sufficient dopant into the semiconductor wafer without producing defects. The surface of the semiconductor wafer is heated to a second peak temperature by further irradiating the semiconductor wafer with flashes of light from flash lamps, so that the dopant is activated. The flash irradiation which is extremely short in irradiation time achieves a high activation rate without excessive diffusion of the dopant.
A method of introducing a dopant into a semiconductor substrate to activate the dopant, said method comprising the steps of:
A method of heating a semiconductor substrate having a surface on which a thin film containing a dopant is formed to introduce the dopant into the semiconductor substrate and activate the dopant, said method comprising the steps of:
Dependencies are inferred from the claim text.