Charged particle beam system and method of operating the same
AssigneesCarl Zeiss Microscopy GmbH, Applied Materials Israel Ltd.
InventorsStefan Schubert, Thomas Kemen, Rainer Knippelmeyer
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AssigneesCarl Zeiss Microscopy GmbH, Applied Materials Israel Ltd.
InventorsStefan Schubert, Thomas Kemen, Rainer Knippelmeyer
Estimating the term…
A method of operating a charged particle beam system, the method comprises extracting a particle beam from a source; performing a first accelerating of the particles of the beam; forming a plurality of particle beamlets from the beam after the performing of the first accelerating; performing a second accelerating of the particles of the beamlets; performing a first decelerating of the particles of the beamlets after the performing of the second accelerating; deflecting the beamlets in a direction oriented transverse to a direction of propagation of the particles of the beamlets after the performing of the first decelerating; performing a second decelerating of the particles of the beamlets after the deflecting of the beamlets; and allowing the particles of the beamlets to be incident on an object surface after the performing of the second decelerating.
A method of operating a charged particle beam system, the method comprising:
A method of operating a charged particle beam system, the method comprising:
A method of operating a charged particle beam system, the method comprising:
A method of operating a charged particle beam system, the method comprising:
Dependencies are inferred from the claim text.