Energy discriminating electron detector and scanning electron microscope using the same
AssigneeNational Institute for Materials Science
InventorsTakashi Sekiguchi, Hideo Iwai
Life of this patent
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AssigneeNational Institute for Materials Science
InventorsTakashi Sekiguchi, Hideo Iwai
Estimating the term…
When an electrode (29) such as a grid applied with a negative voltage is installed in front of an objective lens (23), low energy electrons among secondary electrons (25) generated from a sample (24) by an electron beam or the like is reflected by the electrode to come into a detector (22) installed in the sample (24) side, while electrons of higher energy are not detected, since they are not reflected by the electrode. Accordingly, since only the electrons of lower energy of the secondary electrons can be detected by discriminating the secondary electrons by the energy, it is possible to obtain a detection signal, e.g., rich in the information on the surface state of the sample.
An energy discriminating electron detector comprising:
A scanning electron microscope,
Dependencies are inferred from the claim text.