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US 10,120,084 B2Granted
X-ray detector apparatus
AssigneeIBEX Innovations Ltd.
InventorsGary Gibson, Kurt Scott
Life of this patent
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Abstract
An x-ray detector apparatus includes at least one x-ray detector (3) having a position for a material under test (2), an x-ray source (1), and a plurality of structures (4) each configured to perturb an x-ray energy spectrum differently. The structures (4) may be placed in the path of the x-ray energy spectrum sequentially or concurrently. A plurality of x-ray detectors (3) may be formed into a linear array.
Claims20
An x-ray/gamma-ray detection apparatus, the apparatus including:
- a plurality of x-ray/gamma-ray detectors arranged in at least one linear array,
- a conveyor providing a position for a material under test that moves in relation to the at least one linear array,
- an x-ray/gamma-ray source, and
- at least three adjacent structures arranged side by side in the same plane, wherein the plane of the at least three adjacent structures lies parallel with the at least one linear array, each structure configured to perturb an x-ray/gamma-ray energy spectrum differently from each other, the x-ray/gamma-ray source, the at least one linear array, the position for a material under test, and the at least three adjacent structures being aligned,
- wherein the x-ray/gamma-ray source is arranged to direct an x-ray/gamma-ray energy spectrum to impinge upon, in order, each of:
- a positioned material under test;
- the at least three adjacent structures configured to perturb the x-ray/gamma-ray energy spectrum;
- and the at least one linear array, wherein said structures lie between the position for material under test and the at least one linear array.
5 more elements
Dependencies are inferred from the claim text.