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US 10,120,031 B2Granted
Probe for testing charging/discharging of secondary battery
AssigneeMegatouch, LLC
InventorsWoo Yong Choi, Byung Il Lee, Hyeon Sik Kim
Life of this patent
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Abstract
A charge and discharge test probe for a secondary battery includes: an inner plunger moved up and down by elastic force of a spring; a head having a central through hole through which the inner plunger passes to protrude from an upper end of the head; and a first conductive elastic member mounted to the head.
Claims19
A charge and discharge test probe for a secondary battery, the probe comprising:
- an inner plunger moved up and down by elastic force;
- a head provided with a plurality of probe tips formed on an upper end thereof and a central through hole through which the inner plunger passes to protrude from the upper end of the head;
- and
- a first conductive elastic member mounted to the head,
- wherein the plurality of probe tips have contact points to comes into contact with an electrode terminal of the secondary battery, and
- wherein the first conductive elastic member is elastically deformed by compressive force when the first conductive elastic member comes into contact with the electrode terminal of the secondary battery and is recovered when the compressive force is removed.
3 more elements
Dependencies are inferred from the claim text.