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US 10,120,017 B2Granted
Enabling testing of an integrated circuit at a single temperature
AssigneeAllegro MicroSystems, LLC
InventorsKristann L. Moody, Alejandro G. Milesi, Sam Tran
Life of this patent
Estimating the term…
Abstract
In one aspect, an integrated circuit (IC) includes an output port enabling measurement of a performance characteristic of the IC at a first temperature. The performance characteristic of the IC is a minimum value at the first temperature with respect to any other temperature. The first temperature may be room temperature.
Claims17
An integrated circuit (IC), comprising:
- an output port enabling measurement of a performance characteristic of the IC at a first temperature;
- a first digital-to-analog converter (DAC) configured to receive a first current that is independent of temperature;
- a second DAC configured to receive a second current proportional to temperature;
- a third DAC configured to receive a third current that increases in magnitude above the first temperature and is zero below the first temperature;
- a fourth DAC to receive the output of the first, second and third DACs to produce an output current,
- wherein the output current is weighted to enable the output current to have the minimum value at the first temperature,
- wherein the performance characteristic of the IC is a minimum value at the first temperature with respect to any other temperature.
4 more elements
An integrated circuit (IC), comprising:
- a first digital-to-analog converter (DAC) configured to receive a first current that is independent of temperature;
- a second DAC configured to receive a second current proportional to temperature;
- a third DAC configured to receive a third current that increases in magnitude above room temperature and is zero below the room temperature;
- a fourth DAC to receive the output of the first, second and third DACs to produce an output current,
- an output port enabling measurement of a performance characteristic of the IC at the room temperature,
- wherein the performance characteristic of the IC is a minimum value at the room temperature with respect to any other temperature,
- wherein the performance characteristic is controlled by at least one of current, voltage or a magnetic field,
- wherein the output current is weighted to enable the output current to have the minimum value at the first temperature.
5 more elements
Dependencies are inferred from the claim text.