Test unit
AssigneeNHK Spring Co., Ltd.
InventorsKohei Hironaka, Takashi Nidaira, Tomohiro Yoneda
Life of this patent
Estimating the term…
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AssigneeNHK Spring Co., Ltd.
InventorsKohei Hironaka, Takashi Nidaira, Tomohiro Yoneda
Estimating the term…
A test unit according to the present invention includes: a first contact probe contacting with an electrode provided on a front surface of one of contact targets, and contacting with an electrode of the other contact target; a second contact probe contacting with an electrode provided on a back surface of the one of contact targets and contacting with an electrode of a substrate; a first probe holder including a suction holder that sucks and holds the one of contact targets, and accommodating and holding therein the first contact probes; a second probe holder accommodating and holding therein the second contact probes; and a base portion, which is layered over the first probe holder and holds the other contact target at a side thereof layered over the first probe holder; and a gap is formed between the other contact target and the first probe holder.
A test unit that performs testing of two contact targets, at least of one of which includes electrodes on both sides thereof, the two contact targets being substantially plate shaped and arranged in a layering direction thereof, the test unit comprising:
Dependencies are inferred from the claim text.