Method for measuring the waveform capture rate of a digital storage oscilloscope based on average dead time measurement

A method for measuring the waveform capture rate of a digital storage oscillator (DSO) based on average dead time measurement, the method comprising:

• generating a ramp signal or symmetric triangular wave signal as a base signal, the lasting time of the base signal being T, and a difference between the maximum amplitude of the base signal and the minimum amplitude of the base signal being S;
• generating a trigger signal, the frequency g of which is higher than the nominal maximum waveform capture rate of a DSO under measurement;
• setting trigger parameters of the DSO under measurement according to the base signal and the trigger signal as edge trigger, normal trigger mode, and the trigger source is the input channel of the trigger signal;
• setting the horizontal scale of the DSO under measurement under the fastest real-time sampling rate or the given maximum waveform capture rate, the corresponding acquisition time being h;
• setting the display mode of the DSO under measurement as dot display and infinite persistence;
• setting the memory depth of the DSO under measurement as minimum;
• obtaining a plurality of test signals by delaying the base signal K times, the k th delay time being τk, τk+1>τk, where k is a serial number of the delays, and 1≤k≤K, wherein for each test signal, a plurality of dead times are obtained according to the following steps:
• inputting the trigger signal and the test signal simultaneously to the DSO, wherein under the action of the trigger signal, the DSO under measurement samples the test signal at the maximum waveform capture rate;
• after the pre-set testing time τk+T passes, closing the trigger signal, and measuring the initial voltage of each captured waveform displayed on the DSO under measurement, where the waveform having the same slope belongs to one group, the initial voltage of each captured waveform is noted as vij along the sequence in vertical direction, where i is the group number of captured waveforms, the value scope of i is 1≤i≤M, M is the number of groups of captured waveforms, j indicates the j th captured waveform in the i th group of captured waveforms, wherein the initial voltage is the voltage at the start point of each captured waveform displayed on the DSO under measurement;
• calculating the dead time between two adjacent captured waveforms according to the following equation:
• d
• i
• j
• ,
• j
• +
• 1
• =
• (
• v
• i
• j
• +
• 1
• -
• v
• i
• j
• )
• ⁢
• T
• MS
• -
• h
• ;
• recording each dead time dij,j+1 between the two adjacent captured waveforms to obtain the plurality of dead times;
• calculating the average of the plurality of dead times of the k th signal to obtain an average dead time Dk;
• recording each average dead time of each test signal to obtain a collection of average dead times D={D1, D2, . . . , Dk, . . . , DK}, then calculating the average value D of all average dead times, according to the following equation:
• D
• _
• =
• 1
• K
• ⁢
• ∑
• k
• =
• 1
• K
• ⁢
• D
• k
• ;
• and
• obtaining, based on the average value of all the average dead times, the waveform capture rate of the DSO, the obtaining including calculating the waveform capture rate W of the DSO under measurement according to the following equation:
• W
• _
• =
• 1
• D
• _
• +
• h
• .