Testing probe and semiconductor testing fixture, and fabrication methods thereof

A semiconductor testing fixture, comprising a substrate and a plurality of testing probes, each of the plurality of testing probes comprising:

• a first testing pin including a first testing terminal on a top thereof and a first connection terminal on a bottom thereof;
• an insulating layer covering an entire sidewall surface of the first testing pin;
• and
• a second testing pin on a surface of the insulating layer and including a second testing terminal on a top of the second testing pin and a second connection terminal on a bottom of the second testing pin, wherein a first concave surface is formed on a top of the second testing pin, and surrounds the first testing pin;
• wherein a top surface of the first testing terminal of the first testing pin, a top surface of the insulating layer, and a top surface of the second testing terminal of the second testing pin together form a surface of a near sphere, an ellipsoid, or a spheroid.

A testing probe, comprising:

• a first testing pin including a first testing terminal on a top thereof and a first connection terminal on a bottom thereof;
• an insulating layer covering a sidewall surface of the first testing pin;
• and
• a second testing pin on a surface of the insulating layer and including a second testing terminal on a top of the second testing pin and a second connection terminal on a bottom of the second testing pin, wherein a first concave surface is formed on a top of the second testing pin, and surrounds the first testing pin;
• wherein
• a top surface of the first testing pin and a top surface of the insulating layer are lower than a surface of the second testing terminal of the second testing pin;
• a second concave surface is formed on a surface of the first testing terminal of the first testing pin and the top surface of the insulating layer;
• and
• one edge of the first concave surface is in contact with an edge of the second concave surface, while another edge of the first concave surface is in contact with the top surface of the second testing pin.