US 10,119,992 B2 · High impedance compliant probe tip

Abstract

A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.

Claims17

Dependent claims

A test probe tip, comprising:

a force deflecting assembly;
a resistor configured to be coupled with the force deflecting assembly, wherein the resistor comprises:
a first rod having a substantially semi-cylindrical form that includes a first side extending along a longitudinal axis;
a second rod having a substantially semi-cylindrical form that includes a second side extending along the longitudinal axis;
and
a resistive material disposed between the first side and the second side, such that the resistive element has a substantially cylindrical form with the resistive material providing a conductive path through the center of the cylindrical form;
and
a tip component configured to be coupled with the resistor, wherein the longitudinal axis extends from the force deflecting assembly to the tip component.

5 more elements

Dependencies are inferred from the claim text.

High impedance compliant probe tip

Life of this patent

High impedance compliant probe tip

Life of this patent

Abstract

Claims17