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US 10,119,848 B2Granted
Inspection machine and attachment jig therefor
AssigneeMitutoyo Corporation
InventorsYuki Kurahashi, Masaoki Yamagata
Life of this patent
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AssigneeMitutoyo Corporation
InventorsYuki Kurahashi, Masaoki Yamagata
Estimating the term…
A jig includes three columnar members, a stylus head receiving member, and a jig fixation portion. The second columnar member extends in a Z direction. The first columnar member extends in an X direction and is configured as a cantilever beam protruding in the X direction by having a first end of the first columnar member joined to a first end of the second columnar member. The third columnar member extends in the X direction and is configured as a cantilever beam protruding in the same direction as the first columnar member by having a first end of the third columnar member joined to a second end of the second columnar member. The stylus head receiving member is joined to the third columnar member such that a surface where a stylus head at a forefront end of a spindle of a gauge makes contact faces the first columnar member. The jig fixation portion is provided to the first columnar member so as to be attachable to a measurement spindle of the gauge inspection machine.
An inverse posture inspection jig for arranging a gauge on a gauge inspection machine in an inverse posture so as to enable accuracy of the gauge in the inverse posture to be inspected using the gauge inspection machine based on a display value of the gauge when a measurement spindle, provided to the gauge inspection machine so as to be freely raised and lowered, is displaced to a predetermined position, the jig comprising:
A gauge inspection machine configured to displace a spindle of a gauge and to inspect accuracy of the gauge based on a display value of the gauge when the spindle of the gauge is displaced, the gauge inspection machine comprising:
Dependencies are inferred from the claim text.