Fast absolute-reflectance method for the determination of tear film lipid layer thickness
AssigneeJohnson & Johnson Surgical Vision, Inc.
InventorsStanley W. Huth, Denise Tran
Life of this patent
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AssigneeJohnson & Johnson Surgical Vision, Inc.
InventorsStanley W. Huth, Denise Tran
Estimating the term…
A method for determining reflectivity of a tear film lipid layer of a patient and recommending a course of treatment based on the same. The method includes the steps of: measuring a tear film aqueous plus lipid layer relative reflectance spectrum using a wavelength-dependent optical interferometer; converting the measured tear film aqueous plus lipid layer relative reflectance spectrum to a calculated absolute reflectance spectrum; comparing the calculated absolute reflectance spectrum to a theoretical absolute lipid reflectance spectrum to determine a tear film lipid layer thickness; and determining a reflectivity value for the tear film lipid layer thickness at a first wavelength of light corresponding to ultraviolet, violet, or blue light.
A method of determining tear film lipid layer thickness, comprising the steps of:
A method of determining tear film lipid layer thickness, comprising the steps of:
Dependencies are inferred from the claim text.