Semiconductor device for short-circuiting nodes connected to a word line control circuit and control method for the same
AssigneeKioxia Corporation
InventorsTakeshi Nakano, Mikio Ogawa
Life of this patent
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Abstract
According to one embodiment, a semiconductor device includes a first voltage generator, a second voltage generator, a first MOS transistor, and a controller. The first voltage generator outputs a first voltage to a first node. The second voltage generator outputs a second voltage to a second node. The first MOS transistor is capable of short-circuiting the first node and second node. The controller performs a control operation to short-circuit the first node and second node by turning on the first MOS transistor. The controller controls a period in which the first MOS transistor is kept in an on state based on time.
Claims31
A semiconductor device comprising:
- a first voltage generator circuit which outputs a first voltage to a first node;
- a second voltage generator circuit which outputs a second voltage to a second node;
- a first MOS transistor capable of short-circuiting the first node and second node;
- and
- a controller which performs a control operation to short-circuit the first node and second node by turning on the first MOS transistor, controlling a period in which the first MOS transistor is kept in an on state based on time.
A semiconductor device comprising:
- a memory cell array including i memory cells (i is an integral number larger than 2) capable of holding data each of which includes a charge storage layer and control gate and the i memory cells are serially connected along a current path;
- and
- a voltage generator circuit which generates a first voltage and second voltage, transferring the first and second voltages to word lines connected to the control gates of the memory cells,
- wherein the voltage generator circuit
- transfers the first voltage to the word line connected to the control gate of the ith memory cell, and
- transfers the second voltage to the word lines connected to the control gates of the (i+1)th and (i+2)th memory cells which are arranged on a drain side of the ith memory cell.
A control method of a semiconductor device comprising:
- causing a first voltage generator circuit to generate a first voltage and output the first voltage to a first node;
- causing a second voltage generator circuit to generate a second voltage and output the second voltage to a second node;
- causing a controller to set a first MOS transistor in an on state and short-circuit the first node and second node;
- and
- causing the controller to control a period in which the first MOS transistor is maintained in the on state based on time.
A semiconductor device comprising:
- a memory cell array including a plurality of memory cells connected in series and each memory cell configured to store data;
- a plurality of word lines connected to gates of the memory cells, respectively;
- a word line control circuit configured to control the word lines;
- a first node connected to the word line control circuit;
- a second node connected to the word line control circuit;
- a third node connected to the word line control circuit;
- a first MOS transistor having one end connected to the first node, another end connected to the second node and a gate, the first transistor configured to equalize a voltage level of the first node and a voltage level of the second node by being turned on and short-circuiting the first node and the second node;
- a second transistor having one end connected to the second node, another end connected to the third node and a gate, the second transistor configured to equalize the voltage level of the second node and a voltage level of the third node by being turned on and short-circuiting the second node and the third node;
- and
- a controller connected to the gate of the first transistor and the gate of the second transistor and configured to perform a control operation to short circuit the first node and the second node by turning on the first MOS transistor for a first period of time, controlling a period in which the first MOS transistor is kept in an on state based on time,
- wherein
- the duration of the first period during which the first transistor is turned on to short-circuit the first node and the second node is changed,
- the voltage level of the first node is transferred to at least a first one of the word lines,
- the voltage level of the second node is transferred to at least a second one of the word lines, and
- the voltage level of the third node is transferred to at least a third one of the word lines.
A method for controlling a semiconductor device, the semiconductor device including:
- a memory cell array including a plurality of memory cells connected in series and eac memory cell configured to store data;
- a plurality of word lines connected to gates of the memory cells, respectively;
- a word line control circuit configured to control the word lines;
- a first node connected to the word line control circuit;
- a second node connected to the word line control circuit;
- a third node connected to the word line control circuit;
- a first MOS transistor having one end connected to the first node, another end connected to the second node and a gate, the first transistor configured to equalize a voltage level of the first node and a voltage level of the second node by being turned on and short-circuiting the first node and the second node:
- a second transistor having one end connected to the second node, another end connected to the third node and a gate. the second transistor configured to equalize the voltage level of the second node and a voltage level of the third node by being turned on and short-circuiting the second node and the third node,
- the method comprising:
- causing a controller to supply a control signal to set the gate of the first MOS transistor and the gate of the second transistor to thereby perform a control operation to short circuit the first node and the second node by turning on the first transistor for a first period of time and short circuit the second node and the third node by turning on the second transistor for a second period of time,
- wherein
- the duration of the first period during which the first transistor is turned on to short-circuit the first node and the second node is changed,
- the voltage level of the first node is transferred to at least a first one of the word lines,
- the voltage level of the second node is transferred to at least a second one of the word lines, and
- the voltage level of the third node is transferred to at least a third one of the word lines.
Dependencies are inferred from the claim text.