Systems, methods, and devices for static and dynamic body measurements
AssigneeNextiles, Inc.
InventorGeorge L. Sun
Life of this patent
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AssigneeNextiles, Inc.
InventorGeorge L. Sun
Estimating the term…
In various aspects, embodiments of the disclosure are generally directed to measuring static and dynamic forces of a body using sensors. In particular, a sensor may include a first layer serving as a flexible support material; a second layer on the first layer, the second layer serving as a sensing material; and a third layer on the second layer, the third layer comprising an insulating material. Further, the second layer and the third layer may be coupled using a first electrode comprising a first conductive thread and a first non-conductive thread. Additionally, the first conductive thread may be embedded in the second layer. Also, the first layer and the second layer may be further coupled using a second electrode comprising a second conductive thread and a second non-conductive thread, the second conductive thread may be embedded in the second layer.
A device comprising at least one sensor, the sensor comprising:
An article comprising having at least one device, the device comprising:
The device of claim 30, wherein the first sensor is configured to generate one or more of a bend signal, a pressure signal, a stretch signal, or a signal resulting from a physical deformation of the sensing material.
The device of claim 30, wherein one or more of the first conductive thread, the first non-conductive thread, and the second conductive thread is independently exposed on a surface of the first layer or the second layer.
The device claim 30, wherein one or more of the first conductive thread or the second conductive thread is patterned to comprise one or more exposed regions on the second layer, wherein lengths of the one or more exposed regions are configured to alter one or more of a response time, an input dynamic range, an output dynamic range, and a sensitivity of the sensor.
The device of claim 30, wherein at least one of resistivity, capacitance, or inductance of the sensing material is configured to correspond to an expected pressure load on the sensing material.
The device of claim 30 further comprising one or more additional sensors, wherein the first sensor and the one or more additional sensors have sensing orthogonality properties, and wherein signals received from the first sensor and the one or more additional sensors in response to a physical deformation of the sensing material have opposite signs.
The device of claim 30, wherein a degree of capacitance between the first electrode and the second electrode is configured to correspond to a measure of deformation of the flexible support material.
The device of claim 30, further comprising an array of sensors including the first sensor, the array of sensors being arranged on the flexible support material in a pattern configured to measure electric field tomography.
The device of claim 30, further comprising an array of sensors including the first sensor, the array of sensors being arranged on the flexible support material in a pattern configured to measure electric impedance tomography,
The device of claim 30, further comprising:
A device comprising:
Dependencies are inferred from the claim text.