Dynamic random access memory with isolated well structure
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsKenichi Yasuda, Makoto Suwa, Shigeru Mori
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AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsKenichi Yasuda, Makoto Suwa, Shigeru Mori
Estimating the term…
A semiconductor memory device includes a first conductivity type well in a first conductivity type semiconductor substrate surrounded by a second conductivity type well, one of a memory cell and an external input circuit arranged on the first conductivity type well and the other disposed outside the second conductivity type well. A predetermined power supply voltage is applied to the second conductivity type well and the first conductivity type well is connected to ground. In the structure, charge carriers injected from the external input circuit are absorbed in the second conductivity type well. As a result, the charge carriers are prevented from reaching the memory cell and destroying data stored therein. Therefore, it is possible to miniaturize transistors and increase integration density of dynamic random access memory devices without degrading the source to drain dielectric strength.
A semiconductor memory device comprising:
A semiconductor memory device comprising:
A semiconductor memory device comprising:
Dependencies are inferred from the claim text.