Back to results
US D980,096 S1Granted
Detection system using x-rays
AssigneesMettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
InventorsPeng Jiang, Wanchuan Hu, Xu Sun, Dongsong Li, Liang Zhao, Jian Gong, Guangteng Zhu
Life of this patent
Estimating the term…
Abstract
The abstract isn’t available for this document.
Claims1
The ornamental design for a detection system using X-rays, as shown and described.