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US D894,766 S1Granted
Testing instrument
AssigneeKokusai Keisokuki Kabushiki Kaisha
InventorsSigeru Matsumoto, Hiroshi Miyashita, Kazuhiro Murauchi, Shuichi Tokita
Life of this patent
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Abstract
The abstract isn’t available for this document.
Claims1
The ornamental design for a testing instrument, as shown and described.