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US D383,683 SGranted
Wafer prober
AssigneeTokyo Electron Limited
InventorsOsamu Kamata, Masahiko Sugiyama, Munetoshi Nagasaka, Haruhiko Yoshioka, Kazumi Yamagata
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Abstract
The abstract isn’t available for this document.
Claims1
The ornamental design for wafer prober, as shown.