Polycrystalline silicon sputtering target
AssigneeJX Nippon Mining & Metals Corporation
InventorsHiroshi Takamura, Ryo Suzuki
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AssigneeJX Nippon Mining & Metals Corporation
InventorsHiroshi Takamura, Ryo Suzuki
Estimating the term…
Provided is a polycrystalline silicon target produced by a melting method. In the polycrystalline silicon sputtering target, the average amount of nitride or carbide grains having a size of 100 μm or more for samples of 100×100 mm taken from an arbitrary plane of the target is less than three. Also provided is a method of producing a polycrystalline silicon sputtering target. The method is characterized in that a silicon ingot is produced by melting silicon as a raw material with an electron beam and pouring the molten silicon into a crucible heated at 90° C. or more, and the resulting ingot is machined into a target. The present invention has focused on polycrystalline silicon produced by a melting method, and an object of the present invention is to provide a polycrystalline silicon sputtering target having high quality by reducing the presence of silicon nitride and silicon carbide and to provide a polycrystalline silicon sputtering target having a high bending strength by devising the production process.
A polycrystalline silicon sputtering target produced by a melting method, wherein an average amount of nitride or carbide grains having a size of 100 μm or more for samples of 100×100 mm taken from an arbitrary plane of the polycrystalline silicon sputtering target is less than three, and the polycrystalline silicon sputtering target has a bending strength of 50 MPa or more and a purity, excluding gas components, of 6N or more.
A polycrystalline silicon sputtering target produced by a melting method, wherein an average amount of nitride or carbide grains having a size of 20 μm or more for samples of 100×100 mm taken from an arbitrary plane of the polycrystalline silicon sputtering target is less than three, and the polycrystalline silicon sputtering target has a bending strength of 50 MPa or more and a purity, excluding gas components, of 6N or more.
A method of producing a polycrystalline silicon sputtering target, comprising the steps of:
A method of producing a polycrystalline silicon sputtering target, comprising the steps of:
Dependencies are inferred from the claim text.