Method for removing of residual charge, X-ray imaging method and apparatus using the method
AssigneeSamsung Electronics Co., Ltd.
InventorsYoung Kim, Sunil Kim, Jaechul Park, Kangho Lee
Life of this patent
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Abstract
A method of removing residual charge from a photoconductive material includes applying a first voltage to the photoconductive material to form an electrostatic field during a collection operation in which x-rays are irradiated onto the photoconductive material; and applying a second voltage to the photoconductor to reduce an amount of residual charge therein during a removal operation, the second voltage being different from the first voltage. In one or more example embodiments, the photoconductive material may include Mercury Iodine (Hgl2).
Claims18
A method of removing residual charges from a photoconductive material, the method comprising:
- applying a first voltage between two electrodes to form an electrostatic field during a collection operation in which x-rays are irradiated onto the photoconductive material, wherein a first electrode directly contacts a first end of the photoconductive material and a second electrode directly contacts a second end of the photoconductive material, the second end being opposite to the first end;
- and
- applying a second voltage between the two electrodes to reduce an amount of a residual charge in the photoconductive material during a removal operation,
- wherein applying the second voltage includes applying the second voltage with a polarity that is opposite to a polarity of the first voltage and an absolute value of a magnitude of the second voltage smaller than a magnitude of the first voltage.
A method of forming an x-ray image, the method comprising:
- irradiating a target object with x-rays during a collection operation, at least a portion of the irradiated x-rays being transmitted through the target object onto a photoconductive material;
- applying a first voltage between two electrodes to form an electrostatic field during the collection operation, wherein a first electrode directly contacts a first end of the photoconductive material and a second electrode directly contacts a second end of the photoconductive material, the second end being opposite to the first end;
- and
- applying a second voltage between the two electrodes to reduce an amount of a residual charge in the photoconductive material therein during a removal operation, wherein applying the second voltage includes applying the second voltage with a polarity that is opposite to a polarity of the first voltage and an absolute value of a magnitude of the second voltage smaller than a magnitude of the first voltage.
An x-ray detector comprising:
- a photoconductor having a first surface and a second surface facing each other;
- a common electrode directly contacting the first surface of the photoconductor;
- at least one pixel electrode directly contacting the second surface of the photoconductor;
- and
- a control unit configured to:
- apply a first voltage to the photoconductor to form an electrostatic field during a collection operation in which x-rays are irradiated onto the photoconductor,
- determine, as a function of a residual charge resulting from the collection operation, at least one of magnitude or polarity of a second voltage for reducing an amount of the residual charge, the second voltage being different from the first voltage, and
- apply the second voltage to the photoconductor to reduce an amount of residual charge therein during a removal operation, the second voltage being different from the first voltage, wherein the control unit applies the second voltage with a polarity that is opposite to a polarity of the first voltage and an absolute value of a magnitude of the second voltage smaller than a magnitude of the first voltage.
Dependencies are inferred from the claim text.