Method and system for an optoelectronic built-in self-test system for silicon photonics optical transceivers

A system for communication, the system comprising:

• an optoelectronic transceiver on an optoelectronics die and one or more electronics die, the transceiver having a transmit (Tx) path and a receive (Rx) path, the Rx path comprising a main Rx path and a built-in self-test loopback path, the optoelectronic transceiver being operable to:
• generate a pseudo-random bit sequence (PRBS) signal in the electronics die;
• multiplexing the PRBS signal with an input electrical signal;
• generate an optical signal in the Tx path by applying the multiplexed PRBS signal and input electrical signal to an optical modulator in the optoelectronics die;
• communicate the optical signal to a portion of the built-in self-test loopback path in the optoelectronics die;
• convert the optical signal to an electrical signal in the Rx path utilizing a loopback photodetector in the built-in self-test loopback path, the loopback photodetector being a replica of a photodetector in the main Rx path, wherein both photodetectors comprise SiGe and are integrated into the optoelectronics die;
• and
• assess performance of the Tx and Rx paths by extracting in the electronics die the PRBS signal and the input electrical signal from the electrical signal.

A method for communication, the method comprising:

• in an optoelectronic transceiver on an optoelectronics die and one or more electronics die, the transceiver having a transmit (Tx) path and a receive (Rx) path, the Rx path comprising a main Rx path and a built-in self-test loopback path:
• generating a first electrical signal in the Tx path in the electronics die;
• generating a pseudo-random bit sequence (PRBS) signal in the electronics die;
• multiplexing the first electrical signal with the PRBS signal in the electronics die;
• generating a first optical signal in the Tx path by applying the multiplexed electrical and PRBS signals to an optical modulator in the optoelectronics die;
• receiving a second optical signal in the Rx path and converting to a second electrical signal utilizing a photodetector in the main Rx path;
• communicating the first optical signal to a portion of the built-in self-test loopback path in the optoelectronics die;
• converting the first optical signal to a third electrical signal in the Rx path utilizing a loopback photodetector in the built-in self-test loopback path, the loopback photodetector being a replica of a photodetector in the main Rx path, wherein both photodetectors are in the optoelectronics die;
• multiplexing the second and third electrical signals in the Rx path in the electronics die;
• and
• assessing performance of the Tx and Rx paths by extracting in the electronics die the PRBS signal and the first electrical signal from the multiplexed second and third electrical signals, wherein assessing the performance of the Tx and Rx paths further comprises reducing an input power of the optical signal in the Tx path while monitoring a bit error rate.

A method for communication, the method comprising:

• in an optoelectronic transceiver on an optoelectronics die and one or more electronics die, the transceiver having a transmit (Tx) path and a receive (Rx) path:
• generating a pseudo-random bit sequence (PRBS) signal in the electronics die;
• multiplexing the PRBS signal with an input electrical signal;
• generating an optical signal in the Tx path by applying the multiplexed PRBS signal and input electrical signal to an optical modulator in the optoelectronics die;
• communicating the optical signal to a portion of the Rx path in the optoelectronics die;
• converting the optical signal to an electrical signal in the Rx path utilizing a photodetector in the optoelectronics die;
• and
• assessing performance of the Tx and Rx paths by extracting in the electronics die the PRBS signal and the input electrical signal from the electrical signal, wherein assessing the performance of the Tx and Rx paths further comprises reducing an input power of the optical signal in the Tx path while monitoring a bit error rate.