Diagnostic monitoring for analog-to-digital converters
AssigneeTexas Instruments Incorporated
InventorsTimothy Paul Duryea, Vaibhav Garg
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AssigneeTexas Instruments Incorporated
InventorsTimothy Paul Duryea, Vaibhav Garg
Estimating the term…
The present disclosure describes a channel selector for use in an analog-to-digital converter that has a sampling circuit for converting an analog input to a digital output within a fault tolerance range. The channel selector includes a reception channel, a diagnostic channel, and an impedance compensator. The reception channel receives an analog signal for delivery to the sampling circuit when it is selected for coupling with the sampling circuit. The diagnostic channel receives a diagnostic signal for verifying the digital output of the sampling circuit when it is selected for coupling with the sampling circuit. The impedance compensator is configured to offset a high channel impedance of the reception channel based on the fault tolerance range of the sampling circuit and when the diagnostic channel is selected.
An analog-to-digital converter (ADC), comprising:
A channel selector for use in an analog-to-digital converter having a sampling circuit configured to convert an analog input to a digital output within a fault tolerance range, the channel selector comprising:
A method for verifying a digital output of an analog-to-digital converter (ADC) having a channel selector configured to select a channel for providing an analog input, and a sampling circuit configured to convert the analog input to the digital output, the method comprising:
A device for verifying a digital output of an analog-to-digital converter (ADC), the device comprising:
Dependencies are inferred from the claim text.