Method for forming semiconductor device
AssigneeUnited Microelectronics Corp.
InventorsYi-Liang Ye, Kuang-Hsiu Chen, Chun-Wei Yu, Chueh-Yang Liu, Wen-Jiun Shen, Yu-Ren Wang
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AssigneeUnited Microelectronics Corp.
InventorsYi-Liang Ye, Kuang-Hsiu Chen, Chun-Wei Yu, Chueh-Yang Liu, Wen-Jiun Shen, Yu-Ren Wang
Estimating the term…
The present invention provides a method for forming a semiconductor device, comprising the following steps: firstly, a substrate is provided, having a NMOS region and a PMOS region defined thereon, next, a gate structure is formed on the substrate within the NMOS region, and a disposal spacer is formed on two sides of the gate structure, afterwards, a mask layer is formed on the PMOS region to expose the NMOS region, next, a recess is formed on two sides of the gate structure spaced from the gate structure by the disposal spacer within the NMOS region, the disposal spacer is then removed after the recess is formed, and an epitaxial layer is formed into the recess.
A method for forming a semiconductor device, comprising:
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