Methods and devices for measuring orbital angular momentum states of electrons
AssigneeUniversity of Oregon
InventorsBenjamin J. McMorran, Tyler R. Harvey
Life of this patent
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Abstract
A device for measuring electron orbital angular momentum states in an electron microscope includes the following components aligned sequentially in the following order along an electron beam axis: a phase unwrapper (U) that is a first electrostatic refractive optical element comprising an electrode and a conductive plate, where the electrode is aligned perpendicular to the conductive plate; a first electron lens system (L1); a phase corrector (C) that is a second electrostatic refractive optical element comprising an array of electrodes with alternating electrostatic bias; and a second electron lens system (L2). The phase unwrapper may be a needle electrode or knife edge electrode.
Claims10
A device for enabling measurement of electron orbital angular momentum states in an electron microscope, the device comprising the following components aligned sequentially in the following order along an electron beam axis:
- a phase unwrapper (U) that is a first electrostatic refractive optical element comprising an electrode and a conductive plate, where the electrode is aligned perpendicular to the conductive plate;
- a first electron lens system (L1);
- a phase corrector (C) that is a second electrostatic refractive optical element comprising an array of electrodes with alternating electrostatic bias;
- and
- a second electron lens system (L2).
Dependencies are inferred from the claim text.