Input/output (I/O) line test device and method for controlling the same

An input/output (I/O) line test device comprising:

• a first transmitter configured to output data received from a pad to an input/output line (IOL) when a write enable signal is activated;
• a first receiver configured to output data received from the IOL to the pad during a read enable signal is activated;
• a second receiver configured to output data received from the IOL when a control signal is activated;
• a latch unit configured to store data received from the second receiver;
• a second transmitter configured to output data of the latch unit to the IOL during the read/write enable signals are activated;
• and
• a test controller configured to output the control signal for controlling whether to operate the second receiver in response to the write enable signal and a test signal,
• wherein the input/output line (IOL) is included in a base die,
• wherein, if the second receiver stops operation when the test signal is activated, data received through the pad and the first transmitter during a write operation mode is applied to the IOL.

An input/output (I/O) line test method comprising:

• during a write operation, receiving, by a second receiver, first data received from a first transmitter through an input/output line (IOL) included in a base die, and storing the first data in a latch unit;
• outputting a control signal for controlling a reception operation in response to a write enable signal and a test signal;
• stopping an operation of the second receiver based on the control signal when the test signal is activated;
• applying second data received through the first transmitter to the IOL during the write operation;
• and
• during a read operation, outputting the first data stored in the latch unit to a pad after passing through a second transmitter, the IOL, and a first receiver.

An input/output (I/O) line test device comprising:

• a latch unit configured for storing a first data;
• a pad;
• an I/O line coupled between the latch unit and the pad;
• and
• a signal transceiver coupled between the I/O line and the latch unit,
• wherein the I/O line test device is configured to provide the first data through the pad after second data is stored in the I/O line to verify the operation of the I/O line,
• wherein the input/output line (IOL) is included in a base die,
• wherein, if a reception operation of the signal transceiver is stopped when a test signal is activated, the second data received through the pad during a write operation mode is applied to the IOL.