Probe calibration devices and methods
AssigneeThe Boeing Company
InventorsLydell L. Frasch, Nathaniel P. Roman
Life of this patent
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Abstract
A probe calibration device that includes a first offset element having a substantially rectangular first aperture. The probe calibration device includes a tuned pass element disposed adjacent to the first offset element. The tuned pass element has a non-rectangular second aperture. The probe calibration device includes a second offset element disposed adjacent to the tuned pass element and on a side opposite the first offset element. The second offset element has a substantially rectangular third aperture. The probe calibration device includes a backing element disposed adjacent to the second offset element. The first offset element, the tuned pass element, the second offset element and the backing element form a cavity.
Claims20
A probe calibration device comprising:
- a first offset element having a substantially rectangular first aperture;
- a tuned pass element distinct from the first offset element and disposed adjacent to the first offset element, the tuned pass element including a non-rectangular second aperture;
- a second offset element distinct from the tuned pass element and disposed adjacent to the tuned pass element and on a side opposite the first offset element, the second offset element having a substantially rectangular third aperture;
- and
- a backing element disposed adjacent to the second offset element, wherein the first offset element, the tuned pass element, the second offset element and the backing element form a probe calibration cavity that is closed off by the backing element, the probe calibration cavity dimensioned to provide a target electromagnetic response.
A method of calibrating a probe, the method comprising:
- applying energy to a probe coupled to a calibration device, the calibration device comprising:
- a first offset element having a substantially rectangular first aperture;
- a tuned pass element distinct from the first offset element and disposed adjacent to the first offset element, the tuned pass element including a non-rectangular second aperture;
- a second offset element distinct from the tuned pass element and disposed adjacent to the tuned pass element and on a side opposite the first offset element, the second offset element having a substantially rectangular third aperture;
- and
- a backing element disposed adjacent to the second offset element, wherein the first offset element, the tuned pass element, the second offset element and the backing element form a cavity;
- and
- measuring electromagnetic energy returned by the probe in response to application of the energy to the probe when the probe is coupled to the calibration device.
A method of manufacturing a calibration device, the method comprising:
- obtaining:
- a first offset element having a substantially rectangular first aperture;
- a tuned pass element distinct from the first offset element and including a non-rectangular second aperture;
- a second offset element distinct from the tuned pass element and having a substantially rectangular third aperture;
- and
- a backing element;
- and
- assembling the first offset element, the tuned pass element, the second offset element, and the backing element such that the tuned pass element is adjacent to the first offset element and the second offset element and such that the backing element is disposed adjacent to the second offset element, wherein the first offset element, the tuned pass element, the second offset element and the backing element form a probe calibration cavity that is closed off by the backing element, the probe calibration cavity dimensioned to provide a target electromagnetic response.
Dependencies are inferred from the claim text.