Magnetic field measurement apparatus, magnetic field measurement system and magnetic field measurement method
AssigneeSeiko Epson Corporation
InventorRyuji Hokari
Life of this patent
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Abstract
A magnetic field measurement apparatus includes a first gas cell disposed in a +z direction when seen from an object to be measured, a second gas cell disposed in the +z direction when seen from the first gas cell, a first measurement unit which measures a component of a magnetic field in the first gas cell, a second measurement unit which measures a component of a magnetic field in the second gas cell, a magnetic field generation unit which generates the magnetic field toward the second gas cell so as to reduce the component measured by the second measurement unit, and an output unit which outputs a signal in response to the difference in the components respectively measured by the first measurement unit and second measurement unit.
Claims5
A magnetic field measurement apparatus, comprising:
- a first gas cell;
- a second gas cell;
- the apparatus having a measurement position in which an object to be measured is located,
- the first gas cell and the second gas cell being disposed along a first direction in a given order;
- a first measurement unit which irradiates light to the first gas cell and measures a first direction component of a magnetic field in the first gas cell;
- a second measurement unit which irradiates light to the second gas cell and measures the first direction component of a magnetic field in the second gas cell;
- and
- a magnetic field generation section which generates a magnetic field toward the second gas cell to reduce the first direction component of magnetic field in the second gas cell.
Dependencies are inferred from the claim text.