Defect isolation methods and systems

A test system for testing devices comprising:

• a scanning microscope module, the scanning microscope module, when testing a device under test (DUT), is configured to perturb the DUT with a laser at a test (pixel) location;
• a test module, the test module comprises
• a tester unit,
• a user interface (UI), wherein the UI is a graphical interface, and
• a reference failure log containing prior failing compare vectors of interest;
• and
• a test pattern, wherein the test pattern includes an original sort test pattern which is a 3-Dimensional (3-D) matrix of test vectors corresponding to specific pin names and cycle numbers.

A method of testing a device under test (DUT) comprising:

• providing a tester unit;
• providing a user interface (UI) to initiate a test pattern manipulator to manipulate an original sort test pattern to generate a technical test pattern, wherein the UI comprises a UI configuration page for generating a configuration file and a UI pin selection page;
• providing a reference failure log containing prior failing compare vectors of interest;
• providing a comparator unit, wherein the comparator unit comprises a software comparator;
• and
• testing the DUT using the manipulated test pattern,
• wherein the testing comprises testing at a test location by
• perturbing the DUT at the test location with a laser,
• performing a test run at the test location with the manipulated test pattern,
• if the test run fails testing,
• comparing test vectors to determine if failing test vectors of the test run matches a desired failure signature, and
• generating a trigger pulse if failing test vectors match the desired failure signature, the trigger pulse indicates that the test location of the DUT is a failed location.

The method of 17 wherein the UI configuration page further comprises

• a generate configuration file command button;
• a transfer to tester unit command button;
• and
• location option where a configuration file is to be stored.

The method of 18 comprises

• selecting the tester unit platform with which the configuration file is to be used using the UI configuration page;
• generating the configuration file;
• indicating a saving location;
• and
• transferring the configuration file to a tester system.