Measuring parameters of a cut gemstone

An apparatus for measuring a plurality of parameters of a cut gemstone while it is positioned at a single measurement location, the apparatus comprising:

• a plurality of light sources each configured to emit light at a different one of a plurality of emission wavelengths or ranges of wavelengths such that the emitted light illuminates at least part of the measurement location;
• a sensor assembly configured to sense light at a plurality of sensing wavelengths or ranges of wavelengths for measuring the plurality of parameters, the sensed light being received at the sensor assembly from the measurement location as a result of illumination of a cut gemstone located at the measurement location, wherein the sensor assembly comprises a plurality of sensors, each configured to sense light at a different one or more of the plurality of sensing wavelengths or ranges of wavelengths;
• and
• a multi-furcated optical fibre assembly configured to direct light from the light source assembly to the measurement location and to direct light from the measurement location to the sensor assembly, the multi-furcated optical fibre assembly comprising a plurality of optical fibre filaments, each configured to direct light from one of the plurality of light sources to one of the plurality of sensors;
• wherein the plurality of light sources includes a broadband light source configured to emit light for measuring the absorption of a cut gemstone, and a laser light source configured to emit light at a wavelength suitable for stimulating Raman emission at a detectable wavelength from a cut gemstone;
• and wherein the plurality of sensors includes a first spectrometer configured to sense light at a range of wavelengths for measuring the absorption of a cut gemstone, and a second spectrometer configured to sense light at a range of wavelengths for measuring the Raman emission spectrum of a cut gemstone.