Apparatus and method for evaluation of optical elements
AssigneeLumetrics, Inc.
InventorsFilipp V. Ignatovich, Donald S. Gibson, Michael A. Marcus
Life of this patent
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AssigneeLumetrics, Inc.
InventorsFilipp V. Ignatovich, Donald S. Gibson, Michael A. Marcus
Estimating the term…
An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.
A method for measuring a lens having a focal length and comprising a first surface and a second surface defining a lens thickness therebetween, the method comprising the steps of:
Dependencies are inferred from the claim text.