Method and device for determining a critical angle of an excitation light beam
AssigneeCarl Zeiss Microscopy GmbH
InventorRobin Zur Nieden
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AssigneeCarl Zeiss Microscopy GmbH
InventorRobin Zur Nieden
Estimating the term…
A method for determining a critical angle of total reflection based upon images captured at different angles of incidence of a light beam includes illuminating a sample with an excitation light beam, capturing images of at least part of the sample at a plurality of different angles of incidence of the excitation light beam, and determining a critical angle of total reflection at an interface of the sample based upon analysis of the images. An apparatus for determining a critical angle of total reflection at an interface of a sample includes a light source arrangement to illuminate a sample with an angle of incidence, an image capturing arrangement to capture an image of the sample, and a processing arrangement to determine the critical angle of total reflection at an interface of the sample on the basis of an analysis of images captured at a plurality of different angles of incidence.
A method for determining a critical angle of total reflection, comprising:
An apparatus for determining a critical angle of total reflection at an interface of a sample, comprising:
A method for determining a critical angle of total reflection, comprising:
Dependencies are inferred from the claim text.