Method for measuring level of material level measuring apparatus

A method for measuring a level of a material (30) by a material level measuring apparatus (10), the method comprising:

• inserting a probe (14) of the material level measuring apparatus (10) into the material (30) in a container (20);
• transmitting an electromagnetic wave signal along a surface of the probe (14) toward the material (30) by the material level measuring apparatus (10);
• generating a first reflected signal when the electromagnetic wave signal touches a surface of the material (30);
• transmitting the first reflected signal back to a material level sensing circuit (12) of the material level measuring apparatus (10) along the probe (14);
• generating a second reflected signal when the electromagnetic wave signal touches a bottom of the probe (14);
• transmitting the second reflected signal back to the material level sensing circuit (12) along the probe (14);
• utilizing the first reflected signal to obtain a first time-passing difference value (t1) by the material level sensing circuit (12);
• utilizing the second reflected signal to calculate and obtain a second time-passing difference value (t2) by the material level sensing circuit (12);
• utilizing the first time-passing difference value (t1) to obtain a first material level by the material level sensing circuit (12);
• utilizing the second time-passing difference value (t2) and a predetermined empty container time-passing difference value (t3) of the material level sensing circuit (12) to obtain a second material level by the material level sensing circuit (12);
• utilizing the first material level and the second material level to obtain a third material level by the material level sensing circuit (12);
• sending the third material level to a display unit (40) by the material level sensing circuit (12) after the material level sensing circuit (12) obtains the third material level;
• and
• displaying the third material level by the display unit (40).