US 9,957,640 B2Granted

Single crystal diamond and diamond tool

AssigneesSumitomo Electric Industries, Ltd., Sumitomo Electric Hardmetal Corp.

InventorsYoshiki Nishibayashi, Akihiko Ueda, Hitoshi Sumiya, Yutaka Kobayashi, Yuichiro Seki, Toshiya Takahashi

Life of this patent

Estimating the term…

Loading patent…

Abstract

A single crystal diamond has a surface. In the single crystal diamond, a measurement region is defined in the surface, the measurement region includes a portion exhibiting a transmittance that is highest in the single crystal diamond and a portion exhibiting a transmittance that is lowest in the single crystal diamond, the measurement region has a plurality of square regions that are continuously arranged and each have a side having a length of 0.2 mm, and an average value of transmittances in each of the plurality of square regions is measured, wherein assuming that the average value of the transmittances in one square region is defined as T1 and the average value of the transmittances in another square region adjacent to the one square region is defined as T2, a relation of ((T1−T2)/((T1+T2)/2)×100)/0.2≤20 (%/mm) is satisfied throughout the measurement region.

Claims7

Dependent claims

A single crystal diamond having a surface,

a measurement region within the single crystal diamond being defined in said surface, said measurement region having a plurality of first square regions that are continuously arranged and each have a side having a length of 0.2 mm, said measurement region including a portion exhibiting a transmittance that is highest in said single crystal diamond and a portion exhibiting a transmittance that is lowest in said single crystal diamond, and an average value of said transmittances in each of said plurality of first square regions being measured, wherein assuming that the average value of said transmittances in one first square region of said first square regions is defined as T1 and the average value of said transmittances in another first square region adjacent to said one first square region is defined as T2, a relation of ((T1−T2)/((T1+T2)/2)×100)/0.2≤20 (%/mm) is satisfied throughout said measurement region.

Dependencies are inferred from the claim text.