Capacitive micromachined ultrasonic transducer probe using wire-bonding
AssigneeSamsung Electronics Co., Ltd.
InventorsSungchan Kang, Byunggil Jeong, Sangha Park, Hyungjae Shin
Life of this patent
Estimating the term…
Loading patent…
AssigneeSamsung Electronics Co., Ltd.
InventorsSungchan Kang, Byunggil Jeong, Sangha Park, Hyungjae Shin
Estimating the term…
Provided are capacitive micromachined ultrasonic transducer (CMUT) probes that use wire bonding. A CMUT probe includes a CMUT chip which includes a plurality of first electrode pads which are disposed on a first surface thereof, a printed circuit board (PCB) which is disposed on the first surface of the CMUT chip and which is configured to expose the plurality of first electrode pads, a plurality of second electrode pads which are disposed on the PCB and which correspond to respective ones of the plurality of first electrode pads, and a plurality of wires which connect each respective one of the plurality of first electrode pads to the corresponding one of the plurality of second electrode pads.
A capacitive micromachined ultrasonic transducer (CMUT) probe comprising:
An ultrasonic transducer probe comprising:
Dependencies are inferred from the claim text.